Optical Micrometer For Depth Measuring, Microscope 2034-CIL-ZX
• Optical depth measurement of scratches, cracks, corrosion and other surface defects
• 300x magnification with fine focus
• Mitutoyo gauge with 1 µm resolution for precision depth measurement
• Coaxial and LED ring lights
• Secure MST stand for flat or curved surfaces
Measuring microscope 2034-CIL-300-ZX is the ideal aid for depth measurement of surface defects. The microscope is fitted with a digital dial gauge which measures the distance between two focal planes for non-contact optical measurement of depths, such as holes in circuit boards, scratches in stress critical parts, or cell depths on anilox rollers and intaglio cylinders. Portable and Simple to use with no special training this optical micrometer can be used on flat or curved surfaces to measure depth to an accuracy of +/-20 µm.
A magnification factor of 300x is achieved with the standard 30x objective lens providing the low depth of field needed for precision measurement. The virtually play-free, coaxial drive allows exact focusing on the focal plane. Standard width measurements can also be made with the microscope which has 1 µm graduations on the scale integrated into the ocular (eyepiece). The measuring length of the ocular scale is 0.2 millimetres and the field of vision is 0.48 millimetres.
Coaxial Illumination plays an important role in recognising the focal plans and enabling accurate measurement. The LED brightness is adjustable.
Important for optimal readings: Always focus on the top and bottom focus level from the same side. This is the only way to eliminate inaccuracies in the measurement resulting from a slight backlash in the focus mechanism. The function of the 2034-300-CIL-ZX depth measurement microscope is described in detail in the operating instructions available for downloading.
The fine focusing mechanism can be pushed to the side for quick adjustment. The MST stand provides a secure position on drums or flat material for depth measurement. An additional five millimetre X-adjustment at high magnification allows feed motion between the focal planes, when they can no longer be covered by the field of vision.
The system maybe fitted with a USB camera and software for PC. See model Cellcheck CIL-ZX-USB for further information.
An additional stand with 25 x 25 mm cross table and optional rotating table is available to allow use of the 2034-CIL-300-ZX as a laboratory system. This stand is very useful when performing depth measurements on small parts. In such applications the parts can be positioned precisely with the cross table. Further optional accessories include the two V-blocks, which can be inserted into the rotating table using a fitted pin in the bottom. This allows applications such as quickly and reliably measuring the depth of scratches on round parts without investing a great deal of time. This microscope is also suitable for use as a mobile laboratory for measuring objects such as micrographic sections or other parts using the interchangeable objective and ocular lenses available as options.
The 2034-CIL-300-ZX is shipped in an extremely sturdy plastic transport box. When ordered with the ST-CIL stand, the set is shipped in a special aluminium transport case.
|Product List Attributes||
• Measure depth of cracks, scratches, corrosion and more
|Country of Manufacture||Germany|
|Special Feature||Depth measurement|
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